ALC '97

International Symposium on Atomic Level Characterizations for New Materials and Devices '97

November 23 (Sunday) - 28 (Friday), 1997

Aston Wailea Resort, Maui, Hawaii, USA

The Latest Announcement

(Last Update : Nov. 13, 1997)

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Printed final program will be sent only upon request.

REMARKS

The time allocation for your presentation is as follows:

4-xxPL: Plenary talk. 30 min presentation and 5 min discussion.
n-xxKN: Keynote talk. 20 min presentation and 5 min discussion.
n-xxOR: Oral presentation. 15 min presentation and 5 min discussion.
6-xxSA: Student award short presentation. 5 min presentation. Discussion can be made in Poster Session.
nPxx: Poster presentation. 1.2x1.2 m² poster board.

Please check your presentation program.
If you find something wrong, please send mail to issie@@iis.u-tokyo.ac.jp (Hideshi ISHII)

Final Program

Program Index

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Nov. 23 (Sun)
17:30-19:00 Welcome Reception

Nov. 24 (Mon)
08:40-08:55 Opening Remarks
08:55-10:05 Plenary Talks
10:25-11:40 STM I
19:00-20:10 STM II
20:30-21:40 Depth Profiling

Nov. 25 (Tue)
08:30-10:10 TEM for Next Age I
10:30-12:10 TEM for Next Age II
14:30-16:30 Work Shop I
19:00-20:00 Poster I
20:00-21:40 TEM for Next Age III

Nov. 26 (Wed)
08:30-10:05 Ion Scattering
10:25-12:05 Topics I
14:30-16:30 Work Shop II
19:00-19:35 Student Award
19:35-20:35 Poster II
20:35-21:40 Topics II

Nov. 27 (Thu)
08:30-10:00 STM III
10:20-12:00 Topics III
17:30-20:30 Banquet

Nov. 28 (Fri)
08:30-09:40 Topics IV
10:00-11:15 SIMS
11:15-11:35 Closing Remark

17:30-19:00	Welcome Reception

08:40-08:55	Opening Remarks
08:55-10:05	Plenary Talks
10:25-11:40	STM I
19:00-20:10	STM II
20:30-21:40	Depth Profiling

08:30-10:10	TEM for Next Age I
10:30-12:10	TEM for Next Age II
14:30-16:30	Work Shop I
19:00-20:00	Poster I
20:00-21:40	TEM for Next Age III

08:30-10:05	Ion Scattering
10:25-12:05	Topics I
14:30-16:30	Work Shop II
19:00-19:35	Student Award
19:35-20:35	Poster II
20:35-21:40	Topics II

08:30-10:00	STM III
10:20-12:00	Topics III
17:30-20:30	Banquet

08:30-09:40	Topics IV
10:00-11:15	SIMS
11:15-11:35	Closing Remark

Final Program

4-xxPL: Plenary talk. 30 min presentation and 5 min discussion.
n-xxKN: Keynote talk. 20 min presentation and 5 min discussion.
n-xxOR: Oral presentation. 15 min presentation and 5 min discussion.
6-xxSA: Student award short presentation. 5 min presentation. Discussion can be made in Poster Session.
nPxx: Poster presentation. 1.2x1.2 m² poster board.

Rooms

Nov. 23	Welcome Reception	KAHO'OLAWE LAWN
Nov. 24-28	Oral & Workshop	LOKELANI/LEHUA
	Poster	LEALOHA
Nov. 27	Banquet	LUAU GARDENS

Nov.23(Sun)

17:30 - 19:00 Welcome Reception

Back to the Program Index

Nov.24(Mon)

08:40 - 08:55 Opening Remarks (Chairperson: T. Koshikawa)

Y. Nihei	Chairperson of the Organizing Committee
G. Yokoyama	Deputy Head, University-Industry Cooperation Division, the Japan Society for Promotion of Science

08:55 - 10:05 Plenary Talks (Chairpersons: Y. Nihei and D. B. Williams)

4-01PL Characterization of Surface Properties at High Temperature as Applied to Zr-O/W(100) System R. Shimizu 4-02PL Spin-polarized Low Energy Electron Microscopy of Ultrathin Ferromagnetic Layers and Ferromagnetic / Nonferromagnetic Sandwiches T. Duden and E. Bauer

10:25 - 11:40 STM I (Chairpersons: J. C. Hemminger and M. Aono)

4-03KN Nanocharacterization of Silicon Surfaces Using Selective Photodesorption T. N. Rhodin and C. Paulsen-Boaz 4-04KN Chemical discrimination on atomic level with STM P. Varga 4-05KN Comparative surface study of atomic images with UHV-AFM and STM M. Iwatsuki and S. Kitamura

19:00 - 20:10 STM II (Chairpersons: J. Kirschner and T. Tsong)

4-06KN STM and Laser Desorption Studies of the Growth and Structure of Self-Assembled Monolayers and Their Use as Photoresists for Sub-Micron Patterning of Surfaces M. Dishner, F. J. Feher and J. C. Hemminger 4-07KN Atomic Level Characterization of Electronic and Magnetic States by Observing STM-Induced Light Emission Z.-H.Wu, T.Nakayama, C.Thirstrup, M. Sakurai and M.Aono 4-08OR Theoretical Investigation of Exchange Force Microscopy K. Nakamura, H. Oguchi, H. Hasegawa, K. Sueoka, K. Hayakawa and K. Mukasa

20:30 - 21:40 Depth Profiling (Chairpersons: U. Bardi and H. Yurimoto)

4-09KN High Resolution Medium Energy Ion Scattering Study of Silicon Oxidation and Oxynitridation E. P. Gusev, H. C. Lu, E. Garfunken and T. Gustafsson 4-10KN Approaching Atomic Monolayer Resolution in Sputter Depth Profiling S. Hofmann 4-11OR Depth Profiling of Te-Ge-Sb Optical Disk A. Kojima, T. Matsunaga and N. Yamada

4-01PL	Characterization of Surface Properties at High Temperature as Applied to Zr-O/W(100) System
	R. Shimizu
4-02PL	Spin-polarized Low Energy Electron Microscopy of Ultrathin Ferromagnetic Layers and Ferromagnetic / Nonferromagnetic Sandwiches
	T. Duden and E. Bauer

4-03KN	Nanocharacterization of Silicon Surfaces Using Selective Photodesorption
	T. N. Rhodin and C. Paulsen-Boaz
4-04KN	Chemical discrimination on atomic level with STM
	P. Varga
4-05KN	Comparative surface study of atomic images with UHV-AFM and STM
	M. Iwatsuki and S. Kitamura

4-06KN	STM and Laser Desorption Studies of the Growth and Structure of Self-Assembled Monolayers and Their Use as Photoresists for Sub-Micron Patterning of Surfaces
	M. Dishner, F. J. Feher and J. C. Hemminger
4-07KN	Atomic Level Characterization of Electronic and Magnetic States by Observing STM-Induced Light Emission
	Z.-H.Wu, T.Nakayama, C.Thirstrup, M. Sakurai and M.Aono
4-08OR	Theoretical Investigation of Exchange Force Microscopy
	K. Nakamura, H. Oguchi, H. Hasegawa, K. Sueoka, K. Hayakawa and K. Mukasa

4-09KN	High Resolution Medium Energy Ion Scattering Study of Silicon Oxidation and Oxynitridation
	E. P. Gusev, H. C. Lu, E. Garfunken and T. Gustafsson
4-10KN	Approaching Atomic Monolayer Resolution in Sputter Depth Profiling
	S. Hofmann
4-11OR	Depth Profiling of Te-Ge-Sb Optical Disk
	A. Kojima, T. Matsunaga and N. Yamada

Back to the Program Index

Nov.25(Tue)

08:30 - 10:10 TEM for Next Age I (Chairpersons: M. Isaacson and M. Hibino)
5-01KN Quantitative Atomic Structure Characterization by Electron Microscopy: where are we? D. Van Dyck 5-02KN Design, Performance, and First Results of the Spherically Corrected 200 kV TEM H. Rose, M. Haider, S. Uhlemann, B. Kabius and K. Urban 5-03KN Aberration free imaging techniques based on 3D image processing T. Ikuta 5-04KN Development of Real Time Defocus Image Modulation Processing Electron Microscope Y. Takai, Y. Kimura, T. Ikuta, R. Shimizu, Y. Sato, S. Isakozawa and M. Ichihashi
10:30 - 12:10 TEM for Next Age II (Chairpersons: R. Rose and Y. Takai)
5-05KN Electron holography - progress at atomic dimensions H. Lichte 5-06KN Holography with Low Energy Electrons: Applications in Molecular Biology H.-W. Fink 5-07KN Atomic Imaging in the STEM: A Perspective M. Isaacson 5-08KN A combined Experimental and theoretical approach to atomic scale characterization S. J. Pennycook, M. F. Chisholm, Y. Yan, G. Duschner and S. T. Pantelides
14:30 - 16:30 Workshop I:
What is the instrumental and physical limit on quantification in surface and interface analysis: (Chairpersons: H. Kobayashi, H. Storms and M. Nagoshi); Panelers: S. Suzuki, S. Hayashi, A. Nisawa, K. Obori and D. B. Williams
19:00 - 20:00 Poster Session I
5P01 TEM study of modulated structures in magnetic Fe-Pt sputtered films Y. Seno, H. Aoyama, S. Kuwabara and Y. Honkura 5P02 Facilitation of Synthesis of Super Hard Materials S. Horiuchi, J. Huang, L. He, J. Mao and T. Taniguchi 5P03 A Method to Obtain New Materials by Electron Microscopy - Ta₆₂Te₃₈ Twelvefold Quasicrystal - S. Horiuchi and M. Uchida 5P04 A New Method Using AFM Application Techniques for TEM Observation of Grown-in Defects in As-Grown CZ Silicon Crystals Y. Yanase, T. Ono, T. Kitamura, H. Horie, S. Okamoto and H. Tsuya 5P05 High-resolution Electron Microscopy of New Homologous Compounds InMO₃(ZnO)_m (M=In, Fe, Ga, and Al; m=integer) Chunfei Li, Y. Bando, M. Nakamura and N. Kimizuka 5P06 Position Dependence of the Visibility of a Single Gold Atom in Silicon Crystals in HAADF-STEM Image Simulation K. Nakamura, H. Kakibayashi and N. Tanaka 5P07 Chemical State Analysis of Zinc Compounds by Reflection Electron Energy-Loss Spectroscopy M. Nagoshi 5P08 Detection of surface lattice distortion on a Si(001)-Ge surface using STM T. Ide 5P09 Growth of Si on Si(110) investigated by Scanning Tunneling Microscopy T. Kawasaki, H. Itoh, T. Yasumatsu, D. Sakai, T. Ichinokawa and C. Oshima 5P10 Atomic processes at Ag/Fe and Fe/Ag interfaces H. Noro, R. Persaud and J. A. Venables 5P11 Micro-characterization of GaAs with Secondary Electron Microscopy F. Iwase, T. Matsuda, K. Sekine and H. Maruya 5P12 A 180 ° Deflection Toroidal Analyzer for Photo- and Auger Electron Diffraction S. Shiraki, H. Ishii, M. Owari and Y. Nihei 5P13 Observation of Si(111) Surfaces by Means of Energy-analyzed Electrons M. Suzuki, M. Mogi and Y. Homma 5P14 AR-XPS of surface segregated layer and native oxide layer formed on high-purity iron base alloys S. Suzuki 5P15 Electronic States of Monolayer Micro-Graphite Film on TiC and Ni N. Hasegawa, M. Terai, M. Okuzawa, C. Oshima and S. Otani 5P16 Depth profiling of the doped phosphorous in a silicon dioxide micro particle by gallium focused ion beam SIMS M. Owari, B. Tomiyasu, H. Komatsubara, M. Satoh, S. Sakasegawa and Y. Nihei 5P17 Ion and Electron Dual Focused Beam Apparatus for Three-Dimensional Microanalysis T. Sakamoto, Zhaohui Cheng, M. Takahashi, Y. Kuramoto, M. Owari and Y. Nihei 5P18 Energy Losses of Swift Protons to Hydrogen Atoms K. Tokesi, R. H. Ritchie, T. Nagatomi and R. Shimizu 5P19 Two Dimensional Elemental Mapping with Auger Electrons Induced by Ga Focused Ion Beam Zhaohui Cheng, T. Sakamoto, M. Takahashi, Y. Kuramoto, M. Owari and Y. Nihei 5P20 Metallic Band Structures of a Monolayer Epitaxial Film of Hexagonal Boron Nitride on Ni(111) T. Kawai, J. Nakamura, T. Osaka, M. Tsukada and C. Oshima 5P21 Surface Structures of Thin Films studied by Photoelectron Diffraction H. Ishii, S. Tanigawa, S. Shiraki, T. Nakama, T. Suzuki, T. Kozakai, S. Omori and Y. Nihei 5P22 STM study of the Ag(111) surface upon chlorine exposure B. V. Andryushechkin, U. Bardi, K. N. Eltsov, V. M. Shevlyuga and V. Yu. Yurov 5P23 Improvement of Light Collection Efficiency of Lens Coupled YAG Screen TV System for HVEM K.Yamamoto, T.Tanji, M.Hibino, P.Schauer, R.Autrata
20:00 - 21:40 TEM for Next Age III (Chairpersons: D. Van Dyck and T. Ikuta)
5-09KN Trace Element Detection at Nanometer Scale Spatial Resolution D. E. Newbury 5-10KN Processing sequences of spatially resolved EELS spectra for an improved subnanometer characterization of nanostructures N. Brun, C. Colliex, K. Suenaga, M. Tence and N. Bonnet 5-11KN Nanometer-Scale Microanalysis of Interfaces in Thin Films D. B. Williams, M. Watanabe and D. T. Carpenter 5-12KN Identification of Pinning Sites by Directly Observing Magnetic Flux in High-Tc Superconductors S. Horiuchi, M. Cantoni, M. Uchida, T. Tsuruta and Y. Matsui

5-01KN	Quantitative Atomic Structure Characterization by Electron Microscopy: where are we?
	D. Van Dyck
5-02KN	Design, Performance, and First Results of the Spherically Corrected 200 kV TEM
	H. Rose, M. Haider, S. Uhlemann, B. Kabius and K. Urban
5-03KN	Aberration free imaging techniques based on 3D image processing
	T. Ikuta
5-04KN	Development of Real Time Defocus Image Modulation Processing Electron Microscope
	Y. Takai, Y. Kimura, T. Ikuta, R. Shimizu, Y. Sato, S. Isakozawa and M. Ichihashi

5-05KN	Electron holography - progress at atomic dimensions
	H. Lichte
5-06KN	Holography with Low Energy Electrons: Applications in Molecular Biology
	H.-W. Fink
5-07KN	Atomic Imaging in the STEM: A Perspective
	M. Isaacson
5-08KN	A combined Experimental and theoretical approach to atomic scale characterization
	S. J. Pennycook, M. F. Chisholm, Y. Yan, G. Duschner and S. T. Pantelides

5P01	TEM study of modulated structures in magnetic Fe-Pt sputtered films
	Y. Seno, H. Aoyama, S. Kuwabara and Y. Honkura
5P02	Facilitation of Synthesis of Super Hard Materials
	S. Horiuchi, J. Huang, L. He, J. Mao and T. Taniguchi
5P03	A Method to Obtain New Materials by Electron Microscopy - Ta₆₂Te₃₈ Twelvefold Quasicrystal -
	S. Horiuchi and M. Uchida
5P04	A New Method Using AFM Application Techniques for TEM Observation of Grown-in Defects in As-Grown CZ Silicon Crystals
	Y. Yanase, T. Ono, T. Kitamura, H. Horie, S. Okamoto and H. Tsuya
5P05	High-resolution Electron Microscopy of New Homologous Compounds InMO₃(ZnO)_m (M=In, Fe, Ga, and Al; m=integer)
	Chunfei Li, Y. Bando, M. Nakamura and N. Kimizuka
5P06	Position Dependence of the Visibility of a Single Gold Atom in Silicon Crystals in HAADF-STEM Image Simulation
	K. Nakamura, H. Kakibayashi and N. Tanaka
5P07	Chemical State Analysis of Zinc Compounds by Reflection Electron Energy-Loss Spectroscopy
	M. Nagoshi
5P08	Detection of surface lattice distortion on a Si(001)-Ge surface using STM
	T. Ide
5P09	Growth of Si on Si(110) investigated by Scanning Tunneling Microscopy
	T. Kawasaki, H. Itoh, T. Yasumatsu, D. Sakai, T. Ichinokawa and C. Oshima
5P10	Atomic processes at Ag/Fe and Fe/Ag interfaces
	H. Noro, R. Persaud and J. A. Venables
5P11	Micro-characterization of GaAs with Secondary Electron Microscopy
	F. Iwase, T. Matsuda, K. Sekine and H. Maruya
5P12	A 180 ° Deflection Toroidal Analyzer for Photo- and Auger Electron Diffraction
	S. Shiraki, H. Ishii, M. Owari and Y. Nihei
5P13	Observation of Si(111) Surfaces by Means of Energy-analyzed Electrons
	M. Suzuki, M. Mogi and Y. Homma
5P14	AR-XPS of surface segregated layer and native oxide layer formed on high-purity iron base alloys
	S. Suzuki
5P15	Electronic States of Monolayer Micro-Graphite Film on TiC and Ni
	N. Hasegawa, M. Terai, M. Okuzawa, C. Oshima and S. Otani
5P16	Depth profiling of the doped phosphorous in a silicon dioxide micro particle by gallium focused ion beam SIMS
	M. Owari, B. Tomiyasu, H. Komatsubara, M. Satoh, S. Sakasegawa and Y. Nihei
5P17	Ion and Electron Dual Focused Beam Apparatus for Three-Dimensional Microanalysis
	T. Sakamoto, Zhaohui Cheng, M. Takahashi, Y. Kuramoto, M. Owari and Y. Nihei
5P18	Energy Losses of Swift Protons to Hydrogen Atoms
	K. Tokesi, R. H. Ritchie, T. Nagatomi and R. Shimizu
5P19	Two Dimensional Elemental Mapping with Auger Electrons Induced by Ga Focused Ion Beam
	Zhaohui Cheng, T. Sakamoto, M. Takahashi, Y. Kuramoto, M. Owari and Y. Nihei
5P20	Metallic Band Structures of a Monolayer Epitaxial Film of Hexagonal Boron Nitride on Ni(111)
	T. Kawai, J. Nakamura, T. Osaka, M. Tsukada and C. Oshima
5P21	Surface Structures of Thin Films studied by Photoelectron Diffraction
	H. Ishii, S. Tanigawa, S. Shiraki, T. Nakama, T. Suzuki, T. Kozakai, S. Omori and Y. Nihei
5P22	STM study of the Ag(111) surface upon chlorine exposure
	B. V. Andryushechkin, U. Bardi, K. N. Eltsov, V. M. Shevlyuga and V. Yu. Yurov
5P23	Improvement of Light Collection Efficiency of Lens Coupled YAG Screen TV System for HVEM
	K.Yamamoto, T.Tanji, M.Hibino, P.Schauer, R.Autrata

5-09KN	Trace Element Detection at Nanometer Scale Spatial Resolution
	D. E. Newbury
5-10KN	Processing sequences of spatially resolved EELS spectra for an improved subnanometer characterization of nanostructures
	N. Brun, C. Colliex, K. Suenaga, M. Tence and N. Bonnet
5-11KN	Nanometer-Scale Microanalysis of Interfaces in Thin Films
	D. B. Williams, M. Watanabe and D. T. Carpenter
5-12KN	Identification of Pinning Sites by Directly Observing Magnetic Flux in High-Tc Superconductors
	S. Horiuchi, M. Cantoni, M. Uchida, T. Tsuruta and Y. Matsui

Back to the Program Index

Nov.26(Wed)

08:30 - 10:05 Ion Scattering (Chairpersons: T. Gustafsson and T. Koshikawa)
6-01KN Low energy ion scattering analysis of metal alloy surfaces W. Heiland, M. Aschoff and S. Speller 6-02KN Atomic scale investigations of the composition and structure of bimetallic and oxide surfaces by electron and ion scattering techniques U. Bardi 6-03OR Energy Distributions of Neutral and Positive Particles Ejected from Cu and Si(111)- " 5x5 " -Cu Surfaces Measured by Multiphoton Resonance Ionization R. Ishigami, J. Yuhara and K. Morita 6-04KN Complete Quantification in Surface Analysis Using Sputtering and Photoionization Mass Spectrometry Chun He
10:25 - 12:05 Topics I (Chairpersons: E. Bauer and T. Ichinokawa)
6-05KN Dynamics of Oxygen Molecules and the Very Early Stage of Oxidation of Silicon (111) Surfaces T. Tsong 6-06KN Micro-spectroscopy and spectro-microscopy at surfaces using a photoemission microscope J. Kirschner 6-07KN Mesoscopic Striped Phase on Si(001) Studied by LEEM and STM D. E. Jones, J. P. Pelz, Y. Hong, E. Bauer and I. S. T. Tsong 6-08KN LEEM Studies of GaN and AlN Epitaxy A. Pavlovska, E. Bauer, V. M. Torres, J. L. Edwards, R. B. Doak and I. S. T. Tsong
14:30 - 16:30 Workshop II:
Towards the ultimate depth resolution: (Chairpersons: Y. Homma and S. Hofmann); Panelers: M. G. Dowsett, T. Yasue, S. Ichimura, T. Sakamoto and M. Kudo
19:00 - 19:35 Student Awards (Chairpersons: M. Nagoshi and Y. Homma)
Awarding Ceremony
Y. Nihei
6-09SA Characteristics of Amplified MOS Imager
K. Nagashima and T. Kunihiro
6-10SA Electron Emission from Nb Superconductor
T. Yamashita
6-11SA Dynamic Observation of Diamond Growth on Pt(111) Surface
N. Kobayashi
6-12SA Thermal relaxation process of three dimensional islands on Si(111)7x7 surface
K. Hayashi
6-13SA Reconstruction of the crystal structure by Kikuchi-band analysis in X-ray photo- and Auger electron diffraction
S. Omori
19:35 - 20:35 Poster Session II
6P01 Characteristics of output signal of Amplified MOS Imager K. Nagashima, T. Kunihiro, T. Hirata and H. Yurimoto 6P02 Noise Analysis of Amplified MOS Imager1 T. Kunihiro, K. Nagashima, T. Hirata and H. Yurimoto 6P03 Electron Emission from a Nb superconductor T. Yamashita, S. Utiyama, M. Yamada, H. Fujii, S. Otsuka, K. Nagaoka, T. Osaka, T. Osaka, I. Ohdomari, C. Oshima and T. Sakurai 6P04 Dynamic observation of diamond growth on Pt(111) Surface N. Kobayashi, Y. Kimura and R. Shimizu 6P05 Thermal Relaxation Processes of Three Dimensional Islands on Si(111)7x7 Surface K. Hayashi and A. Ichimiya 6P06 Reconstruction of the crystal structure by Kikuchi-band analysis in X-ray photo- and Auger electron diffraction S. Omori, H. Ishii and Y. Nihei 6P07 Microtopography formed on ion-bombarded InP surfaces Y. Homma 6P08 Analysis of Cu/Si(111) " 5x5 " Structure with High Depth Resolution Medium Energy Ion Scattering T. Yasue, K. Yamashita, A. Ikeda, Y. Kido and T. Koshikawa 6P09 Thin Cu Film Growth on Hydrogen Terminated Si(111) Surfaces T. Koshikawa, T. Yasue and Y. Kido 6P10 Secondary Alkali Ion Emission from Alkali/Si(100) and (111) Surfaces K. Mitsukawa, T. Ueyama, M. Takada, R. S. Li, T. Yasue and T. Koshikawa 6P11 SIMS Analysis of the Sidewall Film Deposited on the Al-Cu Lines H. Kuroki, T. Watadani, J. Kobayashi and F. Baba 6P12 TOF-SIMS Investigation on Secondary Ion Emission from Langmuir-Blodgett Films Formed on Different Substrate Materials M. Kudo, N. Ogura, Y. Ichinohe, S. Yoshida, T. Watanabe, T. Hoshi and K. Endo 6P13 Determination of metal elements in dust sample using SIMS S. Oishi 6P14 Thermal Change of Atomic Structures and Compositions of the (Pb,Sn)/Si(111) surfaces in the Monolayer Regime D. Nakamura, J. Yuhara and K. Morita 6P15 Highly accurate determination of Pt film structures by grazing incidence x-ray reflectivity I. Kojima, Shiqiang Wei, Boquan Li and T. Fujimoto 6P16 A Comparison between Ion and Laser Beam Ionization on Time-of-flight Mass Spectrometry for Insulator Samples M. Ohashi, T. Tsugoshi and T. Kikuchi 6P17 Absolute Auger Electron Spectroscopy: accuracy and detectability K. Goto and R. Shimizu 6P18 Development of a Compact Ultra-Low Energy Ion Gun Y. W. Beag, Y. Kimura, K. Uta, H. Takahashi and R. Shimizu 6P19 Oxidation of Si with high purity ozone investigated by XPS and SHG S. Ichimura, A. Kurokawa and K. Nakamura 6P20 Atomic-hydrogen-induced self-organization processes as observed by STM and low-energy ion scattering K. Oura, M. Katayama, R.-T. Ryu, A. A. Saranin and A. V. Zotov 6P21 Observation of TiN/Ti/Si heterointerface reactions by SIMS and nonresonant laser post-ionization SNMS S. Hayashi 6P22 Surface analysis of ZnSe(111) by coaxial impact collision ion scattering spectroscopy (CAICISS) M. Shinohara, T. Nishihara, N. Matsumura and J. Sasaie
20:35 - 21:40 Topics II (Chairpersons: M. Nagoshi and Y. Homma)
6-14OR Decontamination on Metal Oxides by Heating in the Air K. Yanagiuchi 6-15KN Time-Resolved Electron Microscopy and Its Application N. Osakabe 6-16OR Electron Emission from a Nb superconductor C. Oshima, K. Nagaoka, T. Yamashita, M. Yamada, H.Fujii and S. Utiyama

6-01KN	Low energy ion scattering analysis of metal alloy surfaces
	W. Heiland, M. Aschoff and S. Speller
6-02KN	Atomic scale investigations of the composition and structure of bimetallic and oxide surfaces by electron and ion scattering techniques
	U. Bardi
6-03OR	Energy Distributions of Neutral and Positive Particles Ejected from Cu and Si(111)- " 5x5 " -Cu Surfaces Measured by Multiphoton Resonance Ionization
	R. Ishigami, J. Yuhara and K. Morita
6-04KN	Complete Quantification in Surface Analysis Using Sputtering and Photoionization Mass Spectrometry
	Chun He

6-05KN	Dynamics of Oxygen Molecules and the Very Early Stage of Oxidation of Silicon (111) Surfaces
	T. Tsong
6-06KN	Micro-spectroscopy and spectro-microscopy at surfaces using a photoemission microscope
	J. Kirschner
6-07KN	Mesoscopic Striped Phase on Si(001) Studied by LEEM and STM
	D. E. Jones, J. P. Pelz, Y. Hong, E. Bauer and I. S. T. Tsong
6-08KN	LEEM Studies of GaN and AlN Epitaxy
	A. Pavlovska, E. Bauer, V. M. Torres, J. L. Edwards, R. B. Doak and I. S. T. Tsong

Awarding Ceremony
	Y. Nihei
6-09SA	Characteristics of Amplified MOS Imager
	K. Nagashima and T. Kunihiro
6-10SA	Electron Emission from Nb Superconductor
	T. Yamashita
6-11SA	Dynamic Observation of Diamond Growth on Pt(111) Surface
	N. Kobayashi
6-12SA	Thermal relaxation process of three dimensional islands on Si(111)7x7 surface
	K. Hayashi
6-13SA	Reconstruction of the crystal structure by Kikuchi-band analysis in X-ray photo- and Auger electron diffraction
	S. Omori

6P01	Characteristics of output signal of Amplified MOS Imager
	K. Nagashima, T. Kunihiro, T. Hirata and H. Yurimoto
6P02	Noise Analysis of Amplified MOS Imager1
	T. Kunihiro, K. Nagashima, T. Hirata and H. Yurimoto
6P03	Electron Emission from a Nb superconductor
	T. Yamashita, S. Utiyama, M. Yamada, H. Fujii, S. Otsuka, K. Nagaoka, T. Osaka, T. Osaka, I. Ohdomari, C. Oshima and T. Sakurai
6P04	Dynamic observation of diamond growth on Pt(111) Surface
	N. Kobayashi, Y. Kimura and R. Shimizu
6P05	Thermal Relaxation Processes of Three Dimensional Islands on Si(111)7x7 Surface
	K. Hayashi and A. Ichimiya
6P06	Reconstruction of the crystal structure by Kikuchi-band analysis in X-ray photo- and Auger electron diffraction
	S. Omori, H. Ishii and Y. Nihei
6P07	Microtopography formed on ion-bombarded InP surfaces
	Y. Homma
6P08	Analysis of Cu/Si(111) " 5x5 " Structure with High Depth Resolution Medium Energy Ion Scattering
	T. Yasue, K. Yamashita, A. Ikeda, Y. Kido and T. Koshikawa
6P09	Thin Cu Film Growth on Hydrogen Terminated Si(111) Surfaces
	T. Koshikawa, T. Yasue and Y. Kido
6P10	Secondary Alkali Ion Emission from Alkali/Si(100) and (111) Surfaces
	K. Mitsukawa, T. Ueyama, M. Takada, R. S. Li, T. Yasue and T. Koshikawa
6P11	SIMS Analysis of the Sidewall Film Deposited on the Al-Cu Lines
	H. Kuroki, T. Watadani, J. Kobayashi and F. Baba
6P12	TOF-SIMS Investigation on Secondary Ion Emission from Langmuir-Blodgett Films Formed on Different Substrate Materials
	M. Kudo, N. Ogura, Y. Ichinohe, S. Yoshida, T. Watanabe, T. Hoshi and K. Endo
6P13	Determination of metal elements in dust sample using SIMS
	S. Oishi
6P14	Thermal Change of Atomic Structures and Compositions of the (Pb,Sn)/Si(111) surfaces in the Monolayer Regime
	D. Nakamura, J. Yuhara and K. Morita
6P15	Highly accurate determination of Pt film structures by grazing incidence x-ray reflectivity
	I. Kojima, Shiqiang Wei, Boquan Li and T. Fujimoto
6P16	A Comparison between Ion and Laser Beam Ionization on Time-of-flight Mass Spectrometry for Insulator Samples
	M. Ohashi, T. Tsugoshi and T. Kikuchi
6P17	Absolute Auger Electron Spectroscopy: accuracy and detectability
	K. Goto and R. Shimizu
6P18	Development of a Compact Ultra-Low Energy Ion Gun
	Y. W. Beag, Y. Kimura, K. Uta, H. Takahashi and R. Shimizu
6P19	Oxidation of Si with high purity ozone investigated by XPS and SHG
	S. Ichimura, A. Kurokawa and K. Nakamura
6P20	Atomic-hydrogen-induced self-organization processes as observed by STM and low-energy ion scattering
	K. Oura, M. Katayama, R.-T. Ryu, A. A. Saranin and A. V. Zotov
6P21	Observation of TiN/Ti/Si heterointerface reactions by SIMS and nonresonant laser post-ionization SNMS
	S. Hayashi
6P22	Surface analysis of ZnSe(111) by coaxial impact collision ion scattering spectroscopy (CAICISS)
	M. Shinohara, T. Nishihara, N. Matsumura and J. Sasaie

6-14OR	Decontamination on Metal Oxides by Heating in the Air
	K. Yanagiuchi
6-15KN	Time-Resolved Electron Microscopy and Its Application
	N. Osakabe
6-16OR	Electron Emission from a Nb superconductor
	C. Oshima, K. Nagaoka, T. Yamashita, M. Yamada, H.Fujii and S. Utiyama

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Nov.27(Thu)

08:30 - 10:00 STM III (Chairpersons: M. Iwatsuki and T. Yasue)
7-01KN Low-temperature manipulation of Ag atoms and clusters on Ag(110) surfaces Jiutao Li, W.-D. Schneider and R. Berndt 7-02OR Atomically-Resolved Imaging of Semiconductor Surfaces with Noncontact UHV-AFM S. Morita, Y. Sugawara, T. Uchihashi, H. Ueyama and M. Abe 7-03KN Surfactant-mediated growth of metal films: Cu on O/Ru(0001) Ch. Ammer, K. Meinel, H. Neddermeyer and H. Wolter 7-04OR Hydrogen adsorption and desorption on Si(110) investigated by STM H. Itoh, T. Kawasaki, T. An, T. Ichinokawa and C. Oshima
10:20 - 12:00 Topics III (Chairpersons: R. Franchy and C. Oshima)
7-05KN Elementary physical steps of horizontal and vertical manipulation of atoms and molecules with the STM K. H. Rieder, L. Bartels and G. Meyer 7-06KN Elemental steps in the growth of thin, crystalline oxide, and nitride films - studied by EELS and STM R. Franchy 7-07KN Energy loss functions for electron energy loss spectroscopy T. Nagatomi, K. Tokesi, R. Shimizu and R. H. Ritchie 7-08KN Surface Effects in REELS Spectra K. Tokesi
17:30 - 20:30 Banquet

7-01KN	Low-temperature manipulation of Ag atoms and clusters on Ag(110) surfaces
	Jiutao Li, W.-D. Schneider and R. Berndt
7-02OR	Atomically-Resolved Imaging of Semiconductor Surfaces with Noncontact UHV-AFM
	S. Morita, Y. Sugawara, T. Uchihashi, H. Ueyama and M. Abe
7-03KN	Surfactant-mediated growth of metal films: Cu on O/Ru(0001)
	Ch. Ammer, K. Meinel, H. Neddermeyer and H. Wolter
7-04OR	Hydrogen adsorption and desorption on Si(110) investigated by STM
	H. Itoh, T. Kawasaki, T. An, T. Ichinokawa and C. Oshima

7-05KN	Elementary physical steps of horizontal and vertical manipulation of atoms and molecules with the STM
	K. H. Rieder, L. Bartels and G. Meyer
7-06KN	Elemental steps in the growth of thin, crystalline oxide, and nitride films - studied by EELS and STM
	R. Franchy
7-07KN	Energy loss functions for electron energy loss spectroscopy
	T. Nagatomi, K. Tokesi, R. Shimizu and R. H. Ritchie
7-08KN	Surface Effects in REELS Spectra
	K. Tokesi

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Nov.28(Fri)

08:30 - 09:40 Topics IV (Chairpersons: S. Ichimura and M. Owari)
8-01KN Atomic surface structure of low-dimensional and Amorphous Materials W. Raberg and K. Wandelt 8-02KN Behaviours of liquid metal small islands on Si and SiO₂ T. Ichinokawa and H. Itoh 8-03OR Characterization of selective oxide films on ²⁶Cr ferrite stainless steels by Raman spectroscopy Y. Matsuda and S. Azuma
10:00 - 11:15 SIMS (Chairpersons: W. Heiland and M. Kudo)
8-04KN SIMS Analysis Methods for Deep Sub-micron, Heterojunction, and Quantum Well Technologies M. G. Dowsett 8-05KN Microanalysis Using Ion Microprobes: Contamination Analysis on Focused Ion Beam Processed Areas M. Takai, Y. K. Park, T. Kishimoto, T. Nagai, C. Lehrer, L. Frey and H. Ryssel 8-06KN SIMS, TOF-SIMS and X-ray microanalysis as applied to biology and medicine K. Takaya, M. Okabe, J. Murakami, H. Onozu and T. Yoshida
11:15 - 11:35 Closing Remarks: H. Storms Vice-Chairperson of the Organizing Committee

8-01KN	Atomic surface structure of low-dimensional and Amorphous Materials
	W. Raberg and K. Wandelt
8-02KN	Behaviours of liquid metal small islands on Si and SiO₂
	T. Ichinokawa and H. Itoh
8-03OR	Characterization of selective oxide films on ²⁶Cr ferrite stainless steels by Raman spectroscopy
	Y. Matsuda and S. Azuma

8-04KN	SIMS Analysis Methods for Deep Sub-micron, Heterojunction, and Quantum Well Technologies
	M. G. Dowsett
8-05KN	Microanalysis Using Ion Microprobes: Contamination Analysis on Focused Ion Beam Processed Areas
	M. Takai, Y. K. Park, T. Kishimoto, T. Nagai, C. Lehrer, L. Frey and H. Ryssel
8-06KN	SIMS, TOF-SIMS and X-ray microanalysis as applied to biology and medicine
	K. Takaya, M. Okabe, J. Murakami, H. Onozu and T. Yoshida

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Correction of Program (since Nov. 7)

Date	No.	Item	Wrong (Old)		Corrected		Date of Correction
None	None	None	None		None		None s

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ALC '97

International Symposium on Atomic Level Characterizations for New Materials and Devices '97

November 23 (Sunday) - 28 (Friday), 1997 Aston Wailea Resort, Maui, Hawaii, USA

The Latest Announcement

(Last Update : Nov. 13, 1997)

REMARKS

Final Program

Program Index

Final Program

Constructed by issie@@iis.u-tokyo.ac.jp (Hideshi ISHII)

November 23 (Sunday) - 28 (Friday), 1997

Aston Wailea Resort, Maui, Hawaii, USA