November 23 (Sunday) - 28 (Friday), 1997
Aston Wailea Resort, Maui, Hawaii, USA
| 17:30-19:00 | Welcome Reception |
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| 08:40-08:55 | Opening Remarks |
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| 08:55-10:05 | Plenary Talks |
| 10:25-11:40 | STM I |
| 19:00-20:10 | STM II |
| 20:30-21:40 | Depth Profiling |
| 08:30-10:10 | TEM for Next Age I |
|---|---|
| 10:30-12:10 | TEM for Next Age II |
| 14:30-16:30 | Work Shop I |
| 19:00-20:00 | Poster I |
| 20:00-21:40 | TEM for Next Age III |
| 08:30-10:05 | Ion Scattering |
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| 10:25-12:05 | Topics I |
| 14:30-16:30 | Work Shop II |
| 19:00-19:35 | Student Award |
| 19:35-20:35 | Poster II |
| 20:35-21:40 | Topics II |
| 08:30-10:00 | STM III |
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| 10:20-12:00 | Topics III |
| 17:30-20:30 | Banquet |
| 08:30-09:40 | Topics IV |
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| 10:00-11:15 | SIMS |
| 11:15-11:35 | Closing Remark |
| Nov. 23 | Welcome Reception | KAHO'OLAWE LAWN | |
|---|---|---|---|
| Nov. 24-28 | Oral & Workshop | LOKELANI/LEHUA | |
| Poster | LEALOHA | ||
| Nov. 27 | Banquet | LUAU GARDENS |
| Y. Nihei | Chairperson of the Organizing Committee |
| G. Yokoyama | Deputy Head, University-Industry Cooperation Division, the Japan Society for Promotion of Science |
| 4-01PL | Characterization of Surface Properties at High Temperature as Applied to Zr-O/W(100) System |
|---|---|
| R. Shimizu | |
| 4-02PL | Spin-polarized Low Energy Electron Microscopy of Ultrathin Ferromagnetic Layers and Ferromagnetic / Nonferromagnetic Sandwiches |
| T. Duden and E. Bauer |
| 4-03KN | Nanocharacterization of Silicon Surfaces Using Selective Photodesorption |
|---|---|
| T. N. Rhodin and C. Paulsen-Boaz | |
| 4-04KN | Chemical discrimination on atomic level with STM |
| P. Varga | |
| 4-05KN | Comparative surface study of atomic images with UHV-AFM and STM |
| M. Iwatsuki and S. Kitamura |
| 4-06KN | STM and Laser Desorption Studies of the Growth and Structure of Self-Assembled Monolayers and Their Use as Photoresists for Sub-Micron Patterning of Surfaces |
|---|---|
| M. Dishner, F. J. Feher and J. C. Hemminger | |
| 4-07KN | Atomic Level Characterization of Electronic and Magnetic States by Observing STM-Induced Light Emission |
| Z.-H.Wu, T.Nakayama, C.Thirstrup, M. Sakurai and M.Aono | |
| 4-08OR | Theoretical Investigation of Exchange Force Microscopy |
| K. Nakamura, H. Oguchi, H. Hasegawa, K. Sueoka, K. Hayakawa and K. Mukasa |
| 4-09KN | High Resolution Medium Energy Ion Scattering Study of Silicon Oxidation and Oxynitridation |
|---|---|
| E. P. Gusev, H. C. Lu, E. Garfunken and T. Gustafsson | |
| 4-10KN | Approaching Atomic Monolayer Resolution in Sputter Depth Profiling |
| S. Hofmann | |
| 4-11OR | Depth Profiling of Te-Ge-Sb Optical Disk |
| A. Kojima, T. Matsunaga and N. Yamada |
| 5-01KN | Quantitative Atomic Structure Characterization by Electron Microscopy: where are we? |
|---|---|
| D. Van Dyck | |
| 5-02KN | Design, Performance, and First Results of the Spherically Corrected 200 kV TEM |
| H. Rose, M. Haider, S. Uhlemann, B. Kabius and K. Urban | |
| 5-03KN | Aberration free imaging techniques based on 3D image processing |
| T. Ikuta | |
| 5-04KN | Development of Real Time Defocus Image Modulation Processing Electron Microscope |
| Y. Takai, Y. Kimura, T. Ikuta, R. Shimizu, Y. Sato, S. Isakozawa and M. Ichihashi |
| 5-05KN | Electron holography - progress at atomic dimensions |
|---|---|
| H. Lichte | |
| 5-06KN | Holography with Low Energy Electrons: Applications in Molecular Biology |
| H.-W. Fink | |
| 5-07KN | Atomic Imaging in the STEM: A Perspective |
| M. Isaacson | |
| 5-08KN | A combined Experimental and theoretical approach to atomic scale characterization |
| S. J. Pennycook, M. F. Chisholm, Y. Yan, G. Duschner and S. T. Pantelides |
| 5P01 | TEM study of modulated structures in magnetic Fe-Pt sputtered films |
|---|---|
| Y. Seno, H. Aoyama, S. Kuwabara and Y. Honkura | |
| 5P02 | Facilitation of Synthesis of Super Hard Materials |
| S. Horiuchi, J. Huang, L. He, J. Mao and T. Taniguchi | |
| 5P03 | A Method to Obtain New Materials by Electron Microscopy - Ta62Te38 Twelvefold Quasicrystal - |
| S. Horiuchi and M. Uchida | |
| 5P04 | A New Method Using AFM Application Techniques for TEM Observation of Grown-in Defects in As-Grown CZ Silicon Crystals |
| Y. Yanase, T. Ono, T. Kitamura, H. Horie, S. Okamoto and H. Tsuya | |
| 5P05 | High-resolution Electron Microscopy of New Homologous Compounds InMO3(ZnO)m (M=In, Fe, Ga, and Al; m=integer) |
| Chunfei Li, Y. Bando, M. Nakamura and N. Kimizuka | |
| 5P06 | Position Dependence of the Visibility of a Single Gold Atom in Silicon Crystals in HAADF-STEM Image Simulation |
| K. Nakamura, H. Kakibayashi and N. Tanaka | |
| 5P07 | Chemical State Analysis of Zinc Compounds by Reflection Electron Energy-Loss Spectroscopy |
| M. Nagoshi | |
| 5P08 | Detection of surface lattice distortion on a Si(001)-Ge surface using STM |
| T. Ide | |
| 5P09 | Growth of Si on Si(110) investigated by Scanning Tunneling Microscopy |
| T. Kawasaki, H. Itoh, T. Yasumatsu, D. Sakai, T. Ichinokawa and C. Oshima | |
| 5P10 | Atomic processes at Ag/Fe and Fe/Ag interfaces |
| H. Noro, R. Persaud and J. A. Venables | |
| 5P11 | Micro-characterization of GaAs with Secondary Electron Microscopy |
| F. Iwase, T. Matsuda, K. Sekine and H. Maruya | |
| 5P12 | A 180 ° Deflection Toroidal Analyzer for Photo- and Auger Electron Diffraction |
| S. Shiraki, H. Ishii, M. Owari and Y. Nihei | |
| 5P13 | Observation of Si(111) Surfaces by Means of Energy-analyzed Electrons |
| M. Suzuki, M. Mogi and Y. Homma | |
| 5P14 | AR-XPS of surface segregated layer and native oxide layer formed on high-purity iron base alloys |
| S. Suzuki | |
| 5P15 | Electronic States of Monolayer Micro-Graphite Film on TiC and Ni |
| N. Hasegawa, M. Terai, M. Okuzawa, C. Oshima and S. Otani | |
| 5P16 | Depth profiling of the doped phosphorous in a silicon dioxide micro particle by gallium focused ion beam SIMS |
| M. Owari, B. Tomiyasu, H. Komatsubara, M. Satoh, S. Sakasegawa and Y. Nihei | |
| 5P17 | Ion and Electron Dual Focused Beam Apparatus for Three-Dimensional Microanalysis |
| T. Sakamoto, Zhaohui Cheng, M. Takahashi, Y. Kuramoto, M. Owari and Y. Nihei | |
| 5P18 | Energy Losses of Swift Protons to Hydrogen Atoms |
| K. Tokesi, R. H. Ritchie, T. Nagatomi and R. Shimizu | |
| 5P19 | Two Dimensional Elemental Mapping with Auger Electrons Induced by Ga Focused Ion Beam |
| Zhaohui Cheng, T. Sakamoto, M. Takahashi, Y. Kuramoto, M. Owari and Y. Nihei | |
| 5P20 | Metallic Band Structures of a Monolayer Epitaxial Film of Hexagonal Boron Nitride on Ni(111) |
| T. Kawai, J. Nakamura, T. Osaka, M. Tsukada and C. Oshima | |
| 5P21 | Surface Structures of Thin Films studied by Photoelectron Diffraction |
| H. Ishii, S. Tanigawa, S. Shiraki, T. Nakama, T. Suzuki, T. Kozakai, S. Omori and Y. Nihei | |
| 5P22 | STM study of the Ag(111) surface upon chlorine exposure |
| B. V. Andryushechkin, U. Bardi, K. N. Eltsov, V. M. Shevlyuga and V. Yu. Yurov | |
| 5P23 | Improvement of Light Collection Efficiency of Lens Coupled YAG Screen TV System for HVEM |
| K.Yamamoto, T.Tanji, M.Hibino, P.Schauer, R.Autrata |
| 5-09KN | Trace Element Detection at Nanometer Scale Spatial Resolution |
|---|---|
| D. E. Newbury | |
| 5-10KN | Processing sequences of spatially resolved EELS spectra for an improved subnanometer characterization of nanostructures |
| N. Brun, C. Colliex, K. Suenaga, M. Tence and N. Bonnet | |
| 5-11KN | Nanometer-Scale Microanalysis of Interfaces in Thin Films |
| D. B. Williams, M. Watanabe and D. T. Carpenter | |
| 5-12KN | Identification of Pinning Sites by Directly Observing Magnetic Flux in High-Tc Superconductors |
| S. Horiuchi, M. Cantoni, M. Uchida, T. Tsuruta and Y. Matsui |
| 6-01KN | Low energy ion scattering analysis of metal alloy surfaces |
|---|---|
| W. Heiland, M. Aschoff and S. Speller | |
| 6-02KN | Atomic scale investigations of the composition and structure of bimetallic and oxide surfaces by electron and ion scattering techniques |
| U. Bardi | |
| 6-03OR | Energy Distributions of Neutral and Positive Particles Ejected from Cu and Si(111)- " 5x5 " -Cu Surfaces Measured by Multiphoton Resonance Ionization |
| R. Ishigami, J. Yuhara and K. Morita | |
| 6-04KN | Complete Quantification in Surface Analysis Using Sputtering and Photoionization Mass Spectrometry |
| Chun He |
| 6-05KN | Dynamics of Oxygen Molecules and the Very Early Stage of Oxidation of Silicon (111) Surfaces |
|---|---|
| T. Tsong | |
| 6-06KN | Micro-spectroscopy and spectro-microscopy at surfaces using a photoemission microscope |
| J. Kirschner | |
| 6-07KN | Mesoscopic Striped Phase on Si(001) Studied by LEEM and STM |
| D. E. Jones, J. P. Pelz, Y. Hong, E. Bauer and I. S. T. Tsong | |
| 6-08KN | LEEM Studies of GaN and AlN Epitaxy |
| A. Pavlovska, E. Bauer, V. M. Torres, J. L. Edwards, R. B. Doak and I. S. T. Tsong |
| Awarding Ceremony | |
| Y. Nihei | |
| 6-09SA | Characteristics of Amplified MOS Imager |
|---|---|
| K. Nagashima and T. Kunihiro | |
| 6-10SA | Electron Emission from Nb Superconductor |
| T. Yamashita | |
| 6-11SA | Dynamic Observation of Diamond Growth on Pt(111) Surface |
| N. Kobayashi | |
| 6-12SA | Thermal relaxation process of three dimensional islands on Si(111)7x7 surface |
| K. Hayashi | |
| 6-13SA | Reconstruction of the crystal structure by Kikuchi-band analysis in X-ray photo- and Auger electron diffraction |
| S. Omori | |
| 6P01 | Characteristics of output signal of Amplified MOS Imager |
|---|---|
| K. Nagashima, T. Kunihiro, T. Hirata and H. Yurimoto | |
| 6P02 | Noise Analysis of Amplified MOS Imager1 |
| T. Kunihiro, K. Nagashima, T. Hirata and H. Yurimoto | |
| 6P03 | Electron Emission from a Nb superconductor |
| T. Yamashita, S. Utiyama, M. Yamada, H. Fujii, S. Otsuka, K. Nagaoka, T. Osaka, T. Osaka, I. Ohdomari, C. Oshima and T. Sakurai | |
| 6P04 | Dynamic observation of diamond growth on Pt(111) Surface |
| N. Kobayashi, Y. Kimura and R. Shimizu | |
| 6P05 | Thermal Relaxation Processes of Three Dimensional Islands on Si(111)7x7 Surface |
| K. Hayashi and A. Ichimiya | |
| 6P06 | Reconstruction of the crystal structure by Kikuchi-band analysis in X-ray photo- and Auger electron diffraction |
| S. Omori, H. Ishii and Y. Nihei | |
| 6P07 | Microtopography formed on ion-bombarded InP surfaces |
| Y. Homma | |
| 6P08 | Analysis of Cu/Si(111) " 5x5 " Structure with High Depth Resolution Medium Energy Ion Scattering |
| T. Yasue, K. Yamashita, A. Ikeda, Y. Kido and T. Koshikawa | |
| 6P09 | Thin Cu Film Growth on Hydrogen Terminated Si(111) Surfaces |
| T. Koshikawa, T. Yasue and Y. Kido | |
| 6P10 | Secondary Alkali Ion Emission from Alkali/Si(100) and (111) Surfaces |
| K. Mitsukawa, T. Ueyama, M. Takada, R. S. Li, T. Yasue and T. Koshikawa | |
| 6P11 | SIMS Analysis of the Sidewall Film Deposited on the Al-Cu Lines |
| H. Kuroki, T. Watadani, J. Kobayashi and F. Baba | |
| 6P12 | TOF-SIMS Investigation on Secondary Ion Emission from Langmuir-Blodgett Films Formed on Different Substrate Materials |
| M. Kudo, N. Ogura, Y. Ichinohe, S. Yoshida, T. Watanabe, T. Hoshi and K. Endo | |
| 6P13 | Determination of metal elements in dust sample using SIMS |
| S. Oishi | |
| 6P14 | Thermal Change of Atomic Structures and Compositions of the (Pb,Sn)/Si(111) surfaces in the Monolayer Regime |
| D. Nakamura, J. Yuhara and K. Morita | |
| 6P15 | Highly accurate determination of Pt film structures by grazing incidence x-ray reflectivity |
| I. Kojima, Shiqiang Wei, Boquan Li and T. Fujimoto | |
| 6P16 | A Comparison between Ion and Laser Beam Ionization on Time-of-flight Mass Spectrometry for Insulator Samples |
| M. Ohashi, T. Tsugoshi and T. Kikuchi | |
| 6P17 | Absolute Auger Electron Spectroscopy: accuracy and detectability |
| K. Goto and R. Shimizu | |
| 6P18 | Development of a Compact Ultra-Low Energy Ion Gun |
| Y. W. Beag, Y. Kimura, K. Uta, H. Takahashi and R. Shimizu | |
| 6P19 | Oxidation of Si with high purity ozone investigated by XPS and SHG |
| S. Ichimura, A. Kurokawa and K. Nakamura | |
| 6P20 | Atomic-hydrogen-induced self-organization processes as observed by STM and low-energy ion scattering |
| K. Oura, M. Katayama, R.-T. Ryu, A. A. Saranin and A. V. Zotov | |
| 6P21 | Observation of TiN/Ti/Si heterointerface reactions by SIMS and nonresonant laser post-ionization SNMS |
| S. Hayashi | |
| 6P22 | Surface analysis of ZnSe(111) by coaxial impact collision ion scattering spectroscopy (CAICISS) |
| M. Shinohara, T. Nishihara, N. Matsumura and J. Sasaie |
| 6-14OR | Decontamination on Metal Oxides by Heating in the Air |
|---|---|
| K. Yanagiuchi | |
| 6-15KN | Time-Resolved Electron Microscopy and Its Application |
| N. Osakabe | |
| 6-16OR | Electron Emission from a Nb superconductor |
| C. Oshima, K. Nagaoka, T. Yamashita, M. Yamada, H.Fujii and S. Utiyama |
| 7-01KN | Low-temperature manipulation of Ag atoms and clusters on Ag(110) surfaces |
|---|---|
| Jiutao Li, W.-D. Schneider and R. Berndt | |
| 7-02OR | Atomically-Resolved Imaging of Semiconductor Surfaces with Noncontact UHV-AFM |
| S. Morita, Y. Sugawara, T. Uchihashi, H. Ueyama and M. Abe | |
| 7-03KN | Surfactant-mediated growth of metal films: Cu on O/Ru(0001) |
| Ch. Ammer, K. Meinel, H. Neddermeyer and H. Wolter | |
| 7-04OR | Hydrogen adsorption and desorption on Si(110) investigated by STM |
| H. Itoh, T. Kawasaki, T. An, T. Ichinokawa and C. Oshima |
| 7-05KN | Elementary physical steps of horizontal and vertical manipulation of atoms and molecules with the STM |
|---|---|
| K. H. Rieder, L. Bartels and G. Meyer | |
| 7-06KN | Elemental steps in the growth of thin, crystalline oxide, and nitride films - studied by EELS and STM |
| R. Franchy | |
| 7-07KN | Energy loss functions for electron energy loss spectroscopy |
| T. Nagatomi, K. Tokesi, R. Shimizu and R. H. Ritchie | |
| 7-08KN | Surface Effects in REELS Spectra |
| K. Tokesi |
| 8-01KN | Atomic surface structure of low-dimensional and Amorphous Materials |
|---|---|
| W. Raberg and K. Wandelt | |
| 8-02KN | Behaviours of liquid metal small islands on Si and SiO2 |
| T. Ichinokawa and H. Itoh | |
| 8-03OR | Characterization of selective oxide films on 26Cr ferrite stainless steels by Raman spectroscopy |
| Y. Matsuda and S. Azuma |
| 8-04KN | SIMS Analysis Methods for Deep Sub-micron, Heterojunction, and Quantum Well Technologies |
|---|---|
| M. G. Dowsett | |
| 8-05KN | Microanalysis Using Ion Microprobes: Contamination Analysis on Focused Ion Beam Processed Areas |
| M. Takai, Y. K. Park, T. Kishimoto, T. Nagai, C. Lehrer, L. Frey and H. Ryssel | |
| 8-06KN | SIMS, TOF-SIMS and X-ray microanalysis as applied to biology and medicine |
| K. Takaya, M. Okabe, J. Murakami, H. Onozu and T. Yoshida |
| Date | No. | Item | Wrong (Old) | Corrected | Date of Correction | ||
|---|---|---|---|---|---|---|---|
| None | None | None | None | None | None s |