|
|
Invited Speakers
Tutorial
- Masatake Haruta (Tokyo Metropolitan University, Japan)
- “Catalytic Performance and Atomic Scale Structures of Supported Gold Nanoparticles”
- Franz Hasselbach (Universität Tübingen, Germany)
- “Progress in Low Energy Electron Biprism Interferometry”
- Peter Varga (TU Vienna, Austria)
- “Is an Image Worth More than 1000 WORDS?”
Plenary Talks
- Toshio Ando (Kanazawa University, Japan)
- “Dynamic Imaging of Protein Molecules in Action by High-speed Atomic Force Microscopy”
- Jürgen Kirschner (Max-Planck-Institut für Mikrostrukturphysik, Germany)
- “Spin-polarized Electronic States on Magnetic Nano-islands”
- Hu-Chul Lee (Seoul National University & POSTECH, Republic of Korea)
- “Phase Transition of Grain Boundary Precipitates during Isothermal Aging of Fe-Mn-Ni and Fe-Ni-Ti Alloys”
- Jing Zhu (Tsinghua University, China)
- “Aberration Corrected Electron Microscopy Study of Materials in Beijing National Center for Electron Microscopy”
IUMAS-ALC Joint Session
— Aberration Corrected TEM —
- Harald Rose (University of Ulm, Germany)
- “Prospects and First Results of Aberration-Corrected Low-Voltage Electron Microscopy - The SALVE Project”
- Hidetaka Sawada (JEOL Ltd., Japan)
- “Development of Cs and Cc Correctors for 30kV-Electron Microscope”
- Yimei Zhu (Brookhaven National Laboratory, USA)
- “Sub-angstrom Spatial Resolution in Secondary-electron Imaging Achieved with an Aberration Corrected Scanning (Transmission) Electron Microscope”
IUMAS-ALC Joint Session
— Nanomaterials & Nano Devices —
- Moon J. KIM (University of Texas at Dallas, USA)
- “High Resolution Characterization of Graphene and Graphene-based Devices”
- Kazutomo Suenaga (AIST, Japan)
- “Single-atom Imaging and Spectroscopy in Nano-structured Materials”
Special Session
— Ion Probe Analysis & its Applications —
- Byeon-Gak Choi (Seoul National University, Republic of Korea)
- “Oxygen Isotopic Measurements of Silicates using the NanoSIMS 50 and the SHRIMP IIe at Korea Basic Science Institute”
- Shun-ichi Hayashi (Nippon Steel Corporation, Japan)
- “Matrix Effect-free Shallow Depth Profiling by Resonant Laser Post-ionization SNMS”
- Ming-Chang Liu (CRPG-CNRS, France)
- “High Precision Mg Isotopic Analysis by Ion Microprobe: Application to Dating Early Accretion Processes in the Solar System”
- Jiro Matsuo (Kyoto University, Japan)
- “Bio-imaging Technique with Novel Primary Ions”
- Kevin D. McKeegan (University of California, Los Angeles, USA)
- “The MegaSIMS: a Million-volt Secondary Ion Mass Spectrometer with Ion Imaging Capability”
- Yasunori Yamazaki (RIKEN, Japan)
- “Precise Micro-irradiation of MeV Ion Beams in Liquid: from Cell Surgery to Surface Modification”
- Hisayoshi Yurimoto (Hokkaido University, Japan)
- “Development of Laser Ionization Mass Nanoscope (LIMAS)”
Special Session
— Nanocarbon —
- Matthew F. Chisholm (Oak Ridge National Laboratory, USA)
- “Imaging and Spectroscopy of Chemical and Structural Defects in Single-Layer Materials”
- Roman Fasel (Empa, Swiss Federal Laboratories for Materials Science and Technology, Switzerland)
- “Bottom-up Fabrication of Graphene-related Materials”
- Hiroki Hibino (NTT Basic Reaserch Laboratories, Japan)
- “Growth, Structure, and Transport Properties of Epitaxial Graphene Grown on SiC”
- Byung Hee Hong (Sungkyunkwan University, Republic of Korea)
- “Industrial Applications of Graphene Electrodes”
- Chuhei Oshima (Waseda University, Japan)
- “Graphene, H-BN and BC3 Films on Solid Surfaces”
- Thomas Seyller (University of Erlangen-Nuernberg, Germany)
- “Recent Advances in Epitaxial Graphene on SiC(0001)”
- Hideto Yoshida (Osaka University, Japan)
- “Atomic Scale Observation of Iron Catalyzed Carbon Nanotube Growth by Environmental TEM”
Special Session
— Surface Microscopy —
- Ernst Bauer (Arizona State University, USA)
- “Spin-polarized Low Energy Electron Microscopy of Metallic Multilayers”
- Andrea Locatelli (Elettra - Sincrotrone Trieste S.C.p.A., Italy)
- “Corrugation in Exfoliated Graphene: a LEEM and Microprobe Diffraction Study”
- Frank Meyer zu Heringdorf (University Duisburg-Essen, Germany)
- “Dynamics of Reconstructed Zones Formed Around Islands on Si During Desorption: “Diffusion Made Visible””
- Wolf Widdra (University of Halle-Wittenberg, Germany)
- “Electronic Properties and Domain Structure at Ferroelectric and Antiferromagnetic Oxide Surfaces: A Combined STM/STS, 2PPE and PEEM Study”
Fundamental Phenomena
- Dietrich Menzel (Fritz-Haber-Institut der MPG, Germany)
- “Ultrafast Surface Processes Studied by Core Electron Spectroscopies”
Surface
- Chuck Fadley (University of California, Davis, USA)
- “Surface Physics and Photoelectron Spectroscopy”
- Yuen-Ron Shen (University of California, Berkeley, USA)
- “Sum-frequency Spectroscopy for Characterization of Interfaces”
Nanostructures
- Bhupendra N. Dev (Indian Association for the Cultivation of Science, India)
- “Quantum Size Effects in Electronic and Magnetic Behaviour in Epitaxial Nanostructures”
- Andrew T.S. Wee (National University of Singapore, Singapore)
- “Low Dimensional Organic Nanostructures on Surfaces”
- Han Woong Yeom (POSTECH, Republic of Korea)
- “More Control over Self-assembled Atomic Wires on Surfaces”
Bio Materials
- Terumitsu Hasebe (Toho University, Japan)
- “Improved Adhesion of Fluorine-doped Amorphous Carbon on Metallic Stent for Cardiovascular Disease by Introducing Interlayers with Controlled Surface Free Energies”
- Dae Won Moon (KRISS, Republic of Korea)
- “Development of TOF-nano MEIS and Applications”
Oxides
- Hans-Joachim Freund (Fritz-Haber-Institut der MPG, Germany)
- “Ultra-thin Film Oxides: Materials with Tailored Properties”
- Geoff Thornton (University College London, UK)
- “Imaging and Spectroscopy of Wet Electron States on TiO2”
SPM
- Xi Chen (Tsinghua University, China)
- “Molecular Beam Epitaxy-Scanning Tunneling Microscopy of Topological Insulators”
- Wolf-Dieter Schneider (EPFL, Switzerland)
- “Quantum Oscillations, Superconductivity, Zero-Bias Anomalies, and Coulomb Blockade in Supported Nanoscale Lead Islands”
Imaging Techniques
- Hrvoje Petek (University of Pittsburgh, USA)
- “Imaging Ultrafast Coherent Surface Phenomena by Time-Resolved Photoemission Microscopy”
- Larry Scipioni (Carl Zeiss NTS, USA)
- “Sub-10nm Structuring With Highly Focused Inert Gas Ion Beams”
Characterization by Electrons
- Bokurai Cho (Hitachi High-Technologies Corporation, Republic of Korea)
- “W(310) Cold Field Electron Emission in Extremely High Vacuum Electron Guns”
- Hee Jae Kang (Chungbuk National University, Republic of Korea)
- “Reflection Electron Energy Loss Spectroscopy for Ultrathin Gate Oxide Materials”
Characterization by Ions
- Friedrich Aumayr (TU Wien, Switzerland)
- “Nanosize Surface Modifications by Impact of Individual Ions”
- Philippe Roncin (Université Paris Sud, France)
- “GIFAD (Grazing Incidence Fast Atom Diffraction) to Monitor Cristal Growth Online Observation of the Cristal Mosaicity, Electronic Structure and Reconstruction”
|
