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| Final Program | |||||
| Last Updated on Oct.2 (Chairpersons listed, Poster number rearranged) |
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| Back to
the Top Page |
|||||
| Final Program | |||||
| Last Updated on Oct.2 (Chairpersons listed, Poster number rearranged) |
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Final Version (PDF file)
including Poster Sessions
| Oct. 5 (Sun.) | ||
| Tutorial I | ||
| Room A: Pakalana | ||
| Chairperson: H. Storms | ||
| 9:40 | 10:20 | Oliver C. Wells: The early history and future of the SEM |
| 10:20 | 10:50 | Break |
| 10:50 | 11:30 | Amand A. LUCAS : Diffraction of X-rays and of electrons by helical molecules: determination of the structure of DNA and Carbon nanotubes |
| 11:30 | 12:10 | R. Shimizu: Atomic level characterization as applied to developing cathodes of high brightness |
| 12:10 | 13:40 | Lunch |
| Tutorial II | ||
| Room A: Pakalana | ||
| Chairperson: R. Shimizu | ||
| 13:40 | 14:25 | Dale E. Newbury, John Small, Kent Irwin, Gene Hilton, David Wollman, Shaul Barkan and Jan Iwanczyk: Improving the sensitivity of electron beam microanalytical techniques by enhanced X-ray spectrometry: X-ray microcalorimetry, silicon drift detector energy dispersive X-ray spectrometry, and polycapillary X-ray optics |
| 14:25 | 15:10 | D.B. Williams, M. Watanabe: Quantitative microanalysis and elemental imaging in the AEM |
| 15:10 | 15:40 | Break |
| Chairperson: R. Oiwa | ||
| 15:40 | 16:25 | P. W. Palmberg: Historical perspective on the development of ESCA and Auger instrumentation |
| 16:25 | 17:10 | E. Bauer: Surface electron microscopy with slow electrons |
| 18:00 | 20:00 | Mixer |
| Oct. 6 (Mon.) | ||
| Room A: Pakalana | ||
| 8:30 | 8:50 | Opening (presided over by the chair of excective committee) |
| Opening Address from The Chair of Organizing Committee | ||
| Address from Japan Society for the Promotion of Science (JSPS) | ||
| JSPS 141 Committee Awards Ceremony (presented by the chair of JSPS 141 committee) | ||
| Plenary | ||
| Chairpersons: Y. Nihei and M. Hibino | ||
| 8:50 | 9:35 | G. A. Somorjai: Sum frequency generation-Vibrational spectroscopy characterization of surface monolayers: Catalytic reaction intermediates and polymer surfaces |
| Chairpersons: M. Hibino and Y. Nihei | ||
| 9:35 | 10:20 | Akira Tonomura: 1-MV field emission transmission electron microscope and its applications |
| 10:20 | 10:50 | Break |
| SPM and atomic and molecular manipulation I | ||
| Room A: Pakalana | ||
| Chairpersons: S. Morita and H. Neddermeyer | ||
| 10:50 | 11:20 | M. Aono: Control of Atomic and Molecular Dynamic Processes on the Nanoscale |
| 11:20 | 11:50 | Karl-Heinz Rieder: Doping physics and chemistry with single atoms and molecules: The STM as operative tool |
| Student award ceremony | ||
| 11:50 | 12:30 | Ceremony (presided over by the program committee) |
| Awards presented by the chairperson of organizing committee | ||
| Short Presentations by the Winners | ||
| H.Yanagisawa: The phonon dispersion of a BC3 film on NbB2(0001) surface | ||
| C. Liu: First atomic-scale observations of two-dimensional liquefaction and solidification in real space | ||
| K. Nishinaka: Development of Coincidence Transmission Electron Microscope- Application of Waveform Measurement System - | ||
| T. Fujita: Novel structures of carbon layers on Pt(111) surface | ||
| K. Kaibuchi: The Soft X-ray Analysis of fluorine from BaF2 to HfF4 | ||
| 12:30 | 14:20 | Lunch |
| SPM and atomic and molecular manipulation II | ||
| Room A: Pakalana | ||
| Chairpersons: M. Aono, K. Rieder and P. Varga | ||
| 14:20 | 14:50 | R.E. Palmer: Nanostructured surfaces: fabrication by size-selected clusters, characterisation by local STM spectroscopy (SPELS) and application to immobilisation of proteins |
| 14:50 | 15:20 | Seizo Morita and Yasuhiro Sugawara: Atom selective imaging and mechanical atom manipulation based on noncontact atomic force microscope method |
| 15:20 | 15:50 | Wolf-Dieter Schneider: Two-Dimensional Self-Assembly of a Hexagonal Superlattice of Metallic Adatoms |
| 15:50 | 16:10 | Carl J. Barrelet, Yue Wu, David C. Bell, Charles M. Lieber: Characterization of Nanowires for Photonic Devices |
| 16:10 | 16:40 | Break |
| 16:40 | 17:10 | Y. Fujikawa: STM study on the atomic structure of Ge(105) surface |
| 17:10 | 17:30 | Yoshiyuki HIsada, Yoshihito Mitsuoka, Shinichi Mukainakano, Hidetoshi Suzuki, Tomohiro Aoyama and Ayahiko Ichimiya: Observation of graphitized SiC surfaces by STM |
| Poster I | ||
| Pakalana + Ginger + Mokihana + Prefunction | ||
| 19:00 | 22:00 | (see the PDF version) |
| Oct. 7 (Tue.) | ||
| Special session: LEEM/PEEM | ||
| Room A: Pakalana | ||
| Organized by T. Koshikawa | ||
| 8:30 | 9:00 | E. Bauer: Nanomagnetism Studies with SPLEEM and XMCDPEEM |
| 9:00 | 9:30 | Takanori Koshikawa: Surface observation by LEEM and PEEM and high resolution PEEM by focus moving method |
| 9:30 | 10:00 | M.S. Altman: Low energy electron microscopy of the quantum electronic properties, stability and structure of ultrathin films |
| 10:00 | 10:30 | Thomas Schmidt: Spectromicroscopy with high lateral and spectral resolution: the SMART project at BESSY II |
| 10:30 | 11:00 | Break |
| SPM and atomic and molecular manipulation III | ||
| Room A: Pakalana | ||
| Chairpersons: A. Ichimiya and W. Schneider | ||
| 11:00 | 11:30 | A. Kraus, M. Hanbücken, T. Koshikawa, H. Neddermeyer: Manipulation experiments on Si and surface dynamics by high-temperature STM |
| 11:30 | 12:00 | P. Varga: STM study on the local atomic surface structure of ultra thin Fe films and the INVAR alloy |
| 12:00 | 12:30 | Ernst Meyer, Laurent Nony, Roland Bennewitz, Oliver Pfeiffer, Enrico Gnecco, Anisoara Socoliuc: Force microscopy investigations of molecules on insulators |
| 12:30 | 12:50 | H. Kawakatsu, S. Kawai, D. Kobayashi, S. Meguro, and S. Kitamura: Towards atomic force microscopy up to 100 MHz and atomic resolution lateral force microscopy |
| Surface and interface phenomena I | ||
| Room B: Ginger | ||
| Chairpersons: K. Oura and W. Heiland | ||
| 11:00 | 11:30 | Anastassia Pavlovska: Surface reconstructions of indium in two and three dimensions |
| 11:30 | 12:00 | Maya Kiskinova: Chemical specific imaging and micro-spectroscopy of interfaces and dynamic surface processes with synchrotron-based techniques |
| 12:00 | 12:30 | Tien T. Tsong: Growth of Pb quantum islands on the Si(111) and their electronic properties |
| 12:30 | 12:50 | K. Dohmae, T. Nonaka and Y. Seno: An investigation of Rh on Alumina after Treatments in High-Temperature Oxidizing/Reducing Conditions |
| 12:50 | 14:20 | Lunch |
| Workshop I: High depth characterization of high-k materials | ||
| Room A: Pakalana | ||
| Chairpersons: H. Yoshikawa and M. Schleberger | ||
| 14:20 | 14:50 | Akira Nishiyama, Masahiro Koike, Tsunehiro Ino, Masato Koyama,and Mizuki Ono: Characterization of high-k materials for the advancement of high-speed ULSIs |
| 14:50 | 15:20 | D.G. Starodub, L.V. Goncharova, S. Sayan, T. Nishimura, H. Schulte, E. Garfunkel, T. Gustafsson: Ion scattering studies of alternate gate dielectrics |
| 15:20 | 15:50 | Hidde H. Brongersma: Ultra-thin layers in microelectronics studied by LEIS |
| 15:50 | 16:20 | Y. Kido, A. Tsuda, Y. Hoshino, T. Okazawa, T. Nishimura, T. Nabatame and A. Toriumi: Analysis of alternating HfO2/Al2O3 films grown on Si(001) by atomic layer deposition |
| 16:20 | 16:50 | Break |
| Sponsored session I | ||
| 16:50 | 17:50 | "Surface analysis and nano-order characterization" by JEOL |
| Masaru Takakura: Introduction of Schottky Type Field Emission Electron Probe Microanalyzer | ||
| Toyohiko Tazawa: Micrometer to Nanometer Surface Characterization by XPS and SAM | ||
| Chuck Mooney: Application of ambient and UHV SPMs | ||
| Poster II | ||
| Pakalana + Ginger + Mokihana + Prefunction | ||
| 19:00 | 22:00 | (see the PDF version) |
| Oct. 8 (Wed.) | ||
| Special session: Coherent electron source | ||
| Room A: Pakalana | ||
| Organized by C. Oshima | ||
| 8:30 | 9:00 | C. Oshima: Highly coherent electrons emitted from nano-scaled emitters |
| 9:00 | 9:30 | R. Morin , J. Bardon, A. Degiovanni, V. Georges: Imaging with low-energy electron coherent beams |
| 9:30 | 10:00 | John Miao: Towards atomic resolution 3D diffraction microscopy with coherent X-rays and electrons |
| 10:00 | 10:30 | David C. Joy, Bernhard Frost, and Alex Thesen: Transmission and reflection holography at low energies |
| 10:30 | 11:00 | Break |
| Ion beam (Ion scattering , SIMS and instruments) | ||
| Room A: Pakalana | ||
| Chairpersons: Y. Kido, T. Gustafsson and H. Kang | ||
| 11:00 | 11:30 | Werner Heiland and Abel Robin: What do we know about the elctronic corrugation of surfaces ? |
| 11:30 | 12:00 | J. Wayne Rabalais: Real-space surface crystallography from low energy ion scattering |
| 12:00 | 12:30 | M. Schleberger, M. Dirska, J. Manske: Analysis of magnetic surfaces by scattering of low energy ions |
| 12:30 | 12:50 | S. K. Srivastava, A. Szökefalvi-Nagy, and H.D. Carstanjen: Ion Beam Analysis with Monolayer Depth Resolution: Recent Developments at the Pelletron in Stuttgart |
| Surface and interface analysis | ||
| Room B: Ginger | ||
| Chairpersons: S. Ichimura, R. Palmer and H. Brongersma | ||
| 11:00 | 11:30 | Hisataka Takenaka: Multilayer mirrors for XPS using a Schwarzschild Objective |
| 11:30 | 12:00 | Kyung Joong Kim and Dae Won Moon: Oxidation Mechanism of Si in the Physical Deposition of SiOx |
| 12:00 | 12:30 | M. Bode, O. Pietzsch, A. Kubetzka, and R. Wiesendanger: Imaging magnetic nanostructures by spin-polarized STM |
| 12:30 | 12:50 | S. Thevuthasan, V. Shutthanandan, C.M. Wang, F. Gao and S. Maheswaran: Investigation of buried solid-solid interfaces using ion beam techniques |
| Banquet Luau (Hawaiian style party) | ||
| 17:30 | Shel Lei Greeting and Mai Tai Reception | |
| 18:30 | Call to Dinner | |
| 19:00 | Dinner served | |
| 19:45 | Dinner Show | |
| 20:30 | End of Function | |
| Oct. 9 (Thu.) | ||
| Special session: Photoelectron diffraction & holography | ||
| Room A: Pakalana | ||
| Organized by Y. Nihei | ||
| 8:30 | 9:00 | Yoshimasa NIHEI: 3D atomic structural analysis of surface nano-sturucture by photoelectron diffraction and holography |
| 9:00 | 9:30 | Charles S. Fadley: Probing local atomic structure and buried interfaces via holography and standing waves |
| 9:30 | 10:00 | Jürg Osterwalder, Willi Auwärter, Matthias Muntwiler and Thomas Greber:Growth morphologies and defect structure in hexagonal boron nitride monolayer films on Ni(111): a combined STM and XPD study |
| 10:00 | 10:30 | S. Kono, M. Shimomura and T. Abukawa: Surface structure determination by photoelectron diffraction and electron diffraction |
| 10:30 | 11:00 | Break |
| XPD and SIMS | ||
| Room A: Pakalana | ||
| Chairpersons: M. Owari and M. Bode | ||
| 11:00 | 11:20 | Roman Fasel1 Joachim Wider, Thomas Greber, C. Quitmann, Karl-Heinz Ernst: Determination of the absolute chirality of adsorbed molecules via XPD |
| 11:20 | 11:40 | Hiroshi Daimon: Stereoscopic photographs of atomic arrangement measured by display-type spherical mirror analyzer and circularly polarized light |
| 11:40 | 12:00 | J. W. Lee, K. J. Kim, H. K. Kim and D. W. Moon: Deconvolution of SIMS depth profiles of As multiple delta-layers in silicon |
| 12:00 | 12:30 | B. L. Doyle: Ion-induced emission microscopies - IIEM |
| Nanodevices | ||
| Room B: Ginger | ||
| Chairpersons: S. Hayashi and A. Pavlovska | ||
| 11:00 | 11:30 | A. J. Heinrich, C. P. Lutz, J. A. Gupta, D. M. Eigler: Using scanning tunneling microscopy as a tool for nanotechnology |
| 11:30 | 12:00 | Yoshikazu Homma: Self-assembled nanotube networks for nano-device applications |
| 12:00 | 12:20 | Yue Wu, Carl J. Barrelet, David C. Bell, Charles M. Lieber: Structure analysis of molecular scale single crystal silicon nanowires |
| 12:20 | 12:40 | K. Tanahashi and H. Yamada-Kaneta: Photoluminescence characterization of nano-size defects in sub-surface region of silicon wafers |
| 12:40 | 14:00 | Lunch |
| Workshop II: Low damage high depth resolution by low energy ion sputtering | ||
| Room A: Pakalana | ||
| Chairpersons: Y. Takai and J. Rabalais | ||
| 14:00 | 14:30 | B. Mizuno, C.-G Jin and Y. Sasaki: Shallow junctions and characterization of silicon ULSI's |
| 14:30 | 15:00 | Toshiyuki FUJIMOTO, Takeshi MIZOTA, Hidehiko NONAKA, Akira KUROKAWA and Singo ICHIMURA: Application of metal cluster complex ion beam for low damage sputtering |
| 15:00 | 15:30 | Masahiko INOUE, Ryuichi SHIMIZU, Hyoung Ik LEE and Hee Jae KANG: High resolution Auger depth profiling by sub-keV ion sputtering |
| 15:30 | 16:00 | Hyung-Ik Lee, Dae Won Moon, Hye Chung Shin, Suhk Kun Oh and, Hee Jae Kang: Sub-nm depth resolution in sputter depth profiling by low energy ion bombardment |
| 16:00 | 16:30 | Break |
| Sponsored session II | ||
| Room A: Pakalana | ||
| 16:30 | 17:30 | "HITACHI's imaging and analysis equipement contirbuting to the advancement of nanotechnology" by HITACHI |
| Hiromi Inada, S. Watanabe, H. Tanaka, S. Aizawa, W. Shimoyama, T. Ohashi, T. Hashimoto, S. Isakozawa and K. Nakamura: Development of the HD-2300 scanning transmission electron microscope | ||
| Nobuyuki Osakabe: Hitachi's R&D for providing systems and equipment that our customers demand | ||
| Sponsored session III | ||
| Room A: Pakalana | ||
| 17:30 | 18:30 | "Challenge for Surface and Nanoscale Characterization" by ULVAC-PHI |
| Retsu Oiwa: Activity on surface characterization in ULVAC-PHI and Physical Electronics USA | ||
| Masami Taguchi: Custom system and unique systems for nanotechnology in ULVAC-PHI | ||
| TEM & REM I | ||
| Room A: Pakalana | ||
| Chairpersons: T. Hirayama and H. Rose | ||
| 20:20 | 20:50 | Yimei Zhu: Accurate measurements of valence electron and induction distribution in superconductors and magnetic materials using advanced electron microscopy |
| 20:50 | 21:20 | J-J. Métois: REM investigation of the dynamic of step on silicon |
| Surface and interface phenomena II | ||
| Room A: Pakalana | ||
| Chairpersons: K. Dohmae and M. Kiskinova | ||
| 21:20 | 21:40 | S. Iida, T. Nagatomi and Y. Takai: Self-recovery function of Sc-O/W(100) system as Schottky emitter |
| 21:40 | 22:00 | T. Kono, S. Soga, Y. Koyama, K. Sako, H. Imai, Y. Furukawa, T. Kobayashi, K. Kanekiyo, K. Matsumoto, M. Toita, H. Mochizuki and H. Imai: Precise SIMS depth profiling of SiGe structures using convolution and backside measurement |
| 22:00 | 22:20 | M. N. Khan, P. Kumar, M. Husain, Z. H. Zaidi: Infrared spectroscopic investigations of solid film doped polycyclic aromatic hydrocarbons |
| Oct. 10 (Fri) | ||
| 50 years anniversary of Bi-prism | ||
| Room A: Pakalana | ||
| Chairpersons: R. Shimizu and Y. Zhu | ||
| 8:30 | 9:00 | Hannes Lichte: 50 years of electron biprism - 50 years of exciting electron physics |
| 9:00 | 9:30 | Tsukasa Hirayama, Zhouguang Wang, Takeharu Kato, Kazuo Yamamoto, Naoko Kato, Katsuhiro Sasaki, Hiroyasu Saka: Electron wave interference by a biprism and its application to study two dimensional electric potential distributions in silicon |
| 9:30 | 10:00 | N. Osakabe: Electron holography realized by electron biprism and coherent electron source |
| 10:00 | 10:30 | Break |
| TEM & REM II | ||
| Room A: Pakalana | ||
| Chairpersons: N. Osakabe and J. Métois | ||
| 10:30 | 11:00 | H. Rose: Prospects for aberration-free electron microscopy |
| 11:00 | 11:30 | Yoshizo Takai, Tadahiro Kawasaki and Yoshihide Kimura: Phase transmission electron microscopy with aberration correction based on active defocus modulation |
| 11:30 | 11:50 | Miyoko TANAKA, Masayuki SHIMOJO, Kazutaka MITSUISHI, Ming HAN, Zhi-Quan LIU, and Kazuo FURUYA: Electron beam induced deposition of nano-structures with transmission electron microscopy |
| Closing | ||
| 11:50 | 12:05 | The Chairperson of JSPS 141 Committee |